scanning system Search Results


chirascan cd spectrometer  (Applied Photophysics)
99
Applied Photophysics chirascan cd spectrometer
Chirascan Cd Spectrometer, supplied by Applied Photophysics, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Average 99 stars, based on 1 article reviews
chirascan cd spectrometer - by Bioz Stars, 2026-06
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sem japanese  (JEOL)
96
JEOL sem japanese
Sem Japanese, supplied by JEOL, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Average 96 stars, based on 1 article reviews
sem japanese - by Bioz Stars, 2026-06
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rapid scan ftir method  (Bruker Corporation)
94
Bruker Corporation rapid scan ftir method
(a) Current transient measurements of a bSi-evap and an ITO-ED substrate upon a potential step from −0.9 to 0.3 V Ag/AgCl in the identical in situ electrochemical measurement setup but in the absence of MOP, indicating a faster RC time constant for the bSi-evap substrate. (b) Increase and decrease of the 1615 cm –1 peak intensity over the course of an ad- and <t>desorption</t> <t>rapid-scan</t> <t>FTIR</t> experiment at lower MOP concentrations. (c) Time-dependent increase of the 1615 cm –1 peak intensity during potential step-induced MOP adsorption for high MOP concentrations recorded with step-scan FTIR.
Rapid Scan Ftir Method, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 94/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/rapid scan ftir method/product/Bruker Corporation
Average 94 stars, based on 1 article reviews
rapid scan ftir method - by Bioz Stars, 2026-06
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anti cant1  (Proteintech)
92
Proteintech anti cant1
(a) Current transient measurements of a bSi-evap and an ITO-ED substrate upon a potential step from −0.9 to 0.3 V Ag/AgCl in the identical in situ electrochemical measurement setup but in the absence of MOP, indicating a faster RC time constant for the bSi-evap substrate. (b) Increase and decrease of the 1615 cm –1 peak intensity over the course of an ad- and <t>desorption</t> <t>rapid-scan</t> <t>FTIR</t> experiment at lower MOP concentrations. (c) Time-dependent increase of the 1615 cm –1 peak intensity during potential step-induced MOP adsorption for high MOP concentrations recorded with step-scan FTIR.
Anti Cant1, supplied by Proteintech, used in various techniques. Bioz Stars score: 92/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/anti cant1/product/Proteintech
Average 92 stars, based on 1 article reviews
anti cant1 - by Bioz Stars, 2026-06
92/100 stars
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multiphoton laser scanning microscope  (Olympus)
96
Olympus multiphoton laser scanning microscope
(a) Current transient measurements of a bSi-evap and an ITO-ED substrate upon a potential step from −0.9 to 0.3 V Ag/AgCl in the identical in situ electrochemical measurement setup but in the absence of MOP, indicating a faster RC time constant for the bSi-evap substrate. (b) Increase and decrease of the 1615 cm –1 peak intensity over the course of an ad- and <t>desorption</t> <t>rapid-scan</t> <t>FTIR</t> experiment at lower MOP concentrations. (c) Time-dependent increase of the 1615 cm –1 peak intensity during potential step-induced MOP adsorption for high MOP concentrations recorded with step-scan FTIR.
Multiphoton Laser Scanning Microscope, supplied by Olympus, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Average 96 stars, based on 1 article reviews
multiphoton laser scanning microscope - by Bioz Stars, 2026-06
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confocal microscopy  (Olympus)
99
Olympus confocal microscopy
(a) Current transient measurements of a bSi-evap and an ITO-ED substrate upon a potential step from −0.9 to 0.3 V Ag/AgCl in the identical in situ electrochemical measurement setup but in the absence of MOP, indicating a faster RC time constant for the bSi-evap substrate. (b) Increase and decrease of the 1615 cm –1 peak intensity over the course of an ad- and <t>desorption</t> <t>rapid-scan</t> <t>FTIR</t> experiment at lower MOP concentrations. (c) Time-dependent increase of the 1615 cm –1 peak intensity during potential step-induced MOP adsorption for high MOP concentrations recorded with step-scan FTIR.
Confocal Microscopy, supplied by Olympus, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Average 99 stars, based on 1 article reviews
confocal microscopy - by Bioz Stars, 2026-06
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scanning electron microscopy with edx  (JEOL)
97
JEOL scanning electron microscopy with edx
(a) Current transient measurements of a bSi-evap and an ITO-ED substrate upon a potential step from −0.9 to 0.3 V Ag/AgCl in the identical in situ electrochemical measurement setup but in the absence of MOP, indicating a faster RC time constant for the bSi-evap substrate. (b) Increase and decrease of the 1615 cm –1 peak intensity over the course of an ad- and <t>desorption</t> <t>rapid-scan</t> <t>FTIR</t> experiment at lower MOP concentrations. (c) Time-dependent increase of the 1615 cm –1 peak intensity during potential step-induced MOP adsorption for high MOP concentrations recorded with step-scan FTIR.
Scanning Electron Microscopy With Edx, supplied by JEOL, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/scanning electron microscopy with edx/product/JEOL
Average 97 stars, based on 1 article reviews
scanning electron microscopy with edx - by Bioz Stars, 2026-06
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raw treated sludge  (JEOL)
98
JEOL raw treated sludge
(a) Current transient measurements of a bSi-evap and an ITO-ED substrate upon a potential step from −0.9 to 0.3 V Ag/AgCl in the identical in situ electrochemical measurement setup but in the absence of MOP, indicating a faster RC time constant for the bSi-evap substrate. (b) Increase and decrease of the 1615 cm –1 peak intensity over the course of an ad- and <t>desorption</t> <t>rapid-scan</t> <t>FTIR</t> experiment at lower MOP concentrations. (c) Time-dependent increase of the 1615 cm –1 peak intensity during potential step-induced MOP adsorption for high MOP concentrations recorded with step-scan FTIR.
Raw Treated Sludge, supplied by JEOL, used in various techniques. Bioz Stars score: 98/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/raw treated sludge/product/JEOL
Average 98 stars, based on 1 article reviews
raw treated sludge - by Bioz Stars, 2026-06
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sem analysis  (JEOL)
98
JEOL sem analysis
(a) Current transient measurements of a bSi-evap and an ITO-ED substrate upon a potential step from −0.9 to 0.3 V Ag/AgCl in the identical in situ electrochemical measurement setup but in the absence of MOP, indicating a faster RC time constant for the bSi-evap substrate. (b) Increase and decrease of the 1615 cm –1 peak intensity over the course of an ad- and <t>desorption</t> <t>rapid-scan</t> <t>FTIR</t> experiment at lower MOP concentrations. (c) Time-dependent increase of the 1615 cm –1 peak intensity during potential step-induced MOP adsorption for high MOP concentrations recorded with step-scan FTIR.
Sem Analysis, supplied by JEOL, used in various techniques. Bioz Stars score: 98/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/sem analysis/product/JEOL
Average 98 stars, based on 1 article reviews
sem analysis - by Bioz Stars, 2026-06
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field emission scanning electron microscopy  (JEOL)
96
JEOL field emission scanning electron microscopy
(a) Current transient measurements of a bSi-evap and an ITO-ED substrate upon a potential step from −0.9 to 0.3 V Ag/AgCl in the identical in situ electrochemical measurement setup but in the absence of MOP, indicating a faster RC time constant for the bSi-evap substrate. (b) Increase and decrease of the 1615 cm –1 peak intensity over the course of an ad- and <t>desorption</t> <t>rapid-scan</t> <t>FTIR</t> experiment at lower MOP concentrations. (c) Time-dependent increase of the 1615 cm –1 peak intensity during potential step-induced MOP adsorption for high MOP concentrations recorded with step-scan FTIR.
Field Emission Scanning Electron Microscopy, supplied by JEOL, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Average 96 stars, based on 1 article reviews
field emission scanning electron microscopy - by Bioz Stars, 2026-06
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jsm 7800  (JEOL)
99
JEOL jsm 7800
(a) Current transient measurements of a bSi-evap and an ITO-ED substrate upon a potential step from −0.9 to 0.3 V Ag/AgCl in the identical in situ electrochemical measurement setup but in the absence of MOP, indicating a faster RC time constant for the bSi-evap substrate. (b) Increase and decrease of the 1615 cm –1 peak intensity over the course of an ad- and <t>desorption</t> <t>rapid-scan</t> <t>FTIR</t> experiment at lower MOP concentrations. (c) Time-dependent increase of the 1615 cm –1 peak intensity during potential step-induced MOP adsorption for high MOP concentrations recorded with step-scan FTIR.
Jsm 7800, supplied by JEOL, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/jsm 7800/product/JEOL
Average 99 stars, based on 1 article reviews
jsm 7800 - by Bioz Stars, 2026-06
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jcm 6000 plus  (JEOL)
96
JEOL jcm 6000 plus
(a) Current transient measurements of a bSi-evap and an ITO-ED substrate upon a potential step from −0.9 to 0.3 V Ag/AgCl in the identical in situ electrochemical measurement setup but in the absence of MOP, indicating a faster RC time constant for the bSi-evap substrate. (b) Increase and decrease of the 1615 cm –1 peak intensity over the course of an ad- and <t>desorption</t> <t>rapid-scan</t> <t>FTIR</t> experiment at lower MOP concentrations. (c) Time-dependent increase of the 1615 cm –1 peak intensity during potential step-induced MOP adsorption for high MOP concentrations recorded with step-scan FTIR.
Jcm 6000 Plus, supplied by JEOL, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/jcm 6000 plus/product/JEOL
Average 96 stars, based on 1 article reviews
jcm 6000 plus - by Bioz Stars, 2026-06
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Image Search Results


(a) Current transient measurements of a bSi-evap and an ITO-ED substrate upon a potential step from −0.9 to 0.3 V Ag/AgCl in the identical in situ electrochemical measurement setup but in the absence of MOP, indicating a faster RC time constant for the bSi-evap substrate. (b) Increase and decrease of the 1615 cm –1 peak intensity over the course of an ad- and desorption rapid-scan FTIR experiment at lower MOP concentrations. (c) Time-dependent increase of the 1615 cm –1 peak intensity during potential step-induced MOP adsorption for high MOP concentrations recorded with step-scan FTIR.

Journal: ACS Applied Materials & Interfaces

Article Title: Nanostructured Black Silicon as a Stable and Surface-Sensitive Platform for Time-Resolved In Situ Electrochemical Infrared Absorption Spectroscopy

doi: 10.1021/acsami.3c17294

Figure Lengend Snippet: (a) Current transient measurements of a bSi-evap and an ITO-ED substrate upon a potential step from −0.9 to 0.3 V Ag/AgCl in the identical in situ electrochemical measurement setup but in the absence of MOP, indicating a faster RC time constant for the bSi-evap substrate. (b) Increase and decrease of the 1615 cm –1 peak intensity over the course of an ad- and desorption rapid-scan FTIR experiment at lower MOP concentrations. (c) Time-dependent increase of the 1615 cm –1 peak intensity during potential step-induced MOP adsorption for high MOP concentrations recorded with step-scan FTIR.

Article Snippet: The measurements were carried out by using either the step- or rapid-scan FTIR method (Bruker).

Techniques: In Situ, Adsorption